The 6th edition of IEEE MetroInd4.0&IoT aims to discuss the contributions both of the metrology for the development of Industry 4.0 and IoT and the new opportunities offered by Industry 4.0 and IoT for the development of new measurement methods and instruments.

IEEE MetroInd4.0&IoT wants to federate stakeholders active in developing instrumentation and measurement methods for Industry 4.0 and IoT, with new technologies for metrology-assisted production, component measurement, sensors and associated signal conditioning, and calibration methods for electronic test.

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